Wynik wyszukiwania
Zapytanie: SURFACE AND THIN FILM STRUCTURES 1997
Liczba odnalezionych rekordów: 13



Przejście do opcji zmiany formatu | Wyświetlenie wyników w wersji do druku | Pobranie pliku do edytora | Przesłanie wyników do modułu analizy | excel | Nowe wyszukiwanie
1/13
Nr opisu: 0000025030
An UHV experimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by photoemission yield spectroscopy.
[Aut.]: Lucyna Grządziel, Jacek** Szuber.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 502-504, bibliogr. 15 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

2/13
Nr opisu: 0000025761
Application of the unipole mass filter (UMF) for determination of partial pressuress of gases with near atomic masses.
[Aut.]: Aleksander Król, Jacek** Szuber, S. Kaszczyszyn.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 505-507, bibliogr. 5 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

3/13
Nr opisu: 0000025768
Atomic hydrogen gun for cleaning of GaAs surface.
[Aut.]: Adam* Girycki, Jacek** Szuber.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 495-498, bibliogr. 15 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

4/13
Nr opisu: 0000025890
Determining of diffusion length of carries in thin films of α-Si:H using SSPG technique.
[Aut.]: Marian Nowak, Anna Starczewska.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 420-424, bibliogr. 12 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

5/13
Nr opisu: 0000026003
Examination of physical and chemical properties of thin layers of arsenic-silicon glasses by means of an X-ray microprobe.
[Aut.]: Krzysztof** Waczyński, Edyta Wróbel, Zbigniew** Pruszowski, Michał** Żelechower.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 468-471, bibliogr. 4 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

6/13
Nr opisu: 0000026041
Influence of insulator-semiconductor interface parameters and bulk parameters on frequency dependence of GaAs MIS conductance.
[Aut.]: Stanisław** Kochowski.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 346-350, bibliogr. 9 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

7/13
Nr opisu: 0000026158
Investigations of α-Si thin film using new technique of variable angle reflectometry (VAR).
[Aut.]: Janusz* Jaglarz, Marian Nowak.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 405-408, bibliogr. 8 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

8/13
Nr opisu: 0000027875
Investigations of layered semiconductors using photoreflectance.
[Aut.]: Mirosława Kępińska, Marian Nowak, Ewa** Wilk.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 342-345, bibliogr. 11 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

9/13
Nr opisu: 0000026188
Optical and photoelectrical investigations of Ge20Se69Bi11 thin films.
[Aut.]: Mirosława Kępińska, Marian Nowak, S. Okuniewicz, Barbara Solecka.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 417-419, bibliogr. 9 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

10/13
Nr opisu: 0000026187
Optical properties of magnetron sputtered α-Si:H treated with a CO2 laser.
[Aut.]: Andrzej Grabowski, Marian Nowak.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 401-404, bibliogr. 10 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

11/13
Nr opisu: 0000026019
Some optical properties of amorphous In-Se thin films.
[Aut.]: A. Michalewicz, B. Jarząbek, Jan* Cisowski, J. Jurasik, A. Burian, J. Weszka.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 411-416, bibliogr. 15 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

12/13
Nr opisu: 0000026061
Sulfide passivation of GaAs surface.
[Aut.]: Jacek** Szuber, G. Hollinger, E. Bergignat.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 328-337, bibliogr. 58 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

13/13
Nr opisu: 0000026115
The influence of heating of silicon glasses and anodic oxides on their electrophysical properties.
[Aut.]: Stanisław* Łoś, Krzysztof** Waczyński, Edyta Wróbel.
W: Surface and thin film structures 1997. Proceedings of the 5th seminar, Ustroń, Poland, September 23-26, 1997. Ed. by J. Szuber. Warszawa : Institute of Electron Technology, 1998, s. 450-454, bibliogr. 9 poz. (Electron Technology ; vol. 31, no. 3/4 0070-9816)

stosując format:
Nowe wyszukiwanie