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Zapytanie: ANN REPORT SILES TECH UNIV INST PHYS
Liczba odnalezionych rekordów: 96



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1/96
Nr opisu: 0000073285
Acoustoelectric method of surface carrier mobility investigation. Study of GaP(110) surface.
[Aut.]: Tadeusz Pustelny.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 18-19, bibliogr. 6 poz.

2/96
Nr opisu: 0000073287
Amplitudinal distributions of the rate of acoustic emission counts as an advanced descriptors in measurements of partial discharge in power transformers.
[Aut.]: Franciszek Witos.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 24-27, bibliogr. 4 poz.

3/96
Nr opisu: 0000073288
Bayesian method to study the precision of dating by means of the "wiggle matching" procedure.
[Aut.]: Tomasz* Goslar.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 28-29, bibliogr. 5 poz.

4/96
Nr opisu: 0000073301
Description of the exchange effects in dilute magnetic semiconductor quantum structures.
[Aut.]: Jan* Cisowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 52, bibliogr. 1 poz.

5/96
Nr opisu: 0000073284
Electric properties of the semiconducting layer of phthalocyanine in gas sensors of the SAW type.
[Aut.]: Wiesław Jakubik.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 15-17, bibliogr. 2 poz.

6/96
Nr opisu: 0000073295
Frequency behaviour of GaAs MIS capacitance and conductance.
[Aut.]: Stanisław** Kochowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 41, bibliogr. 2 poz.

7/96
Nr opisu: 0000073291
III-V semiconductor surfaces and interfaces.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 33-34, bibliogr. 4 poz.

8/96
Nr opisu: 0000073298
Influence of CO2 laser treatment on optical parameters and structure of mobility GAP of amorphous silicon.
[Aut.]: Andrzej Grabowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 44-51, bibliogr. 11 poz.

9/96
Nr opisu: 0000073289
Measurments of 14C and 3H at natural abundance level using liquid scintillation β spectrometry.
[Aut.]: Jacek Pawlyta.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 30, bibliogr. 2 poz.

10/96
Nr opisu: 0000073282
Modeling of the electrodiffusion process for the ion exchange in glass.
[Aut.]: Marek Błahut.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 9-11, bibliogr. 2 poz.

11/96
Nr opisu: 0000073419
Numerical calculations of the rotational contributions to a scattering coefficient in the piezoelectric LiTaO3 crystal.
[Aut.]: Tomasz Błachowicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 38-40, bibliogr. 9 poz.

12/96
Nr opisu: 0000073297
Optical, photoelectric and photomagnetoelectric investigations of semiconductors.
[Aut.]: Marian** Nowak.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 42-44

13/96
Nr opisu: 0000073293
Organic semiconductor thin films.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 36-37, bibliogr. 6 poz.

14/96
Nr opisu: 0000073292
Oxide semiconductor surfaces and thin films.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 35-36, bibliogr. 6 poz.

15/96
Nr opisu: 0000073283
Planar difference interferometer used as waveguide sensor.
[Aut.]: Kazimierz Gut.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 11-14, bibliogr. 3 poz.

16/96
Nr opisu: 0000073299
Semimagnetic semiconductors based on II-V compounds.
[Aut.]: Jan* Cisowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 51-52, bibliogr. 1 poz.

17/96
Nr opisu: 0000073290
Standardization of gas amplification description in proportional counters.
[Aut.]: Andrzej** Zastawny.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 31-32, bibliogr. 13 poz.

18/96
Nr opisu: 0000073296
The penetration depth of Rayleigh surface waves.
[Aut.]: Eugeniusz** Soczkiewicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 41, bibliogr. 1 poz.

19/96
Nr opisu: 0000073286
Transversal equivalent circuit model of a filter with a surface acoustic wave.
[Aut.]: Marian** Urbańczyk.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1997, s. 21-23, bibliogr. 7 poz.

20/96
Nr opisu: 0000073238
Application of the Fabry-Perot interferometer in Brillouin scattering experiments.
[Aut.]: Tomasz Błachowicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 36-38, bibliogr. 4 poz.

21/96
Nr opisu: 0000073245
Averaged spin of Mn ions in dilute magnetic semiconductor quantum structures.
[Aut.]: Jan* Cisowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 47-48, bibliogr. 2 poz.

22/96
Nr opisu: 0000073220
Calibration of radiocarbon time scale in the Alleröd and younger dry as periods using annually laminated sediments of Polish lakes.
[Aut.]: Tomasz* Goslar.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 18-20, bibliogr. 3 poz.

23/96
Nr opisu: 0000073232
Carbon and sulphur sable isotope composition in peat profiles as a possible record of global changes.
[Aut.]: Anna** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 26-27, bibliogr. 2 poz.

24/96
Nr opisu: 0000073225
Comparison of radiocarbon and U/Th dates of speleothems.
[Aut.]: Tomasz* Goslar.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 22-23, bibliogr. 4 poz.

25/96
Nr opisu: 0000073240
Detection by "mirage" effect in photothermal experiments - wave optics approach.
[Aut.]: Jerzy Bodzenta.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 38-39, bibliogr. 3 poz.

26/96
Nr opisu: 0000073229
Environment in the past. paleoclimatic implications of lake-level and groundwater-level changes in the Lake Gościąż area.
[Aut.]: Anna** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 24-25, bibliogr. 3 poz.

27/96
Nr opisu: 0000073234
III-V semiconductor surfaces and interfaces.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 29-32, bibliogr. 10 poz.

28/96
Nr opisu: 0000073223
Modelling the atmospheric radiocarbon concentrations in the Late Glacial and early holocene.
[Aut.]: Tomasz* Goslar.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 20-21, bibliogr. 3 poz.

29/96
Nr opisu: 0000073241
Numerical analysis of MIS GaAs capacitance versus frequency characteristics.
[Aut.]: Stanisław** Kochowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 39-40, bibliogr. 2 poz.

30/96
Nr opisu: 0000073131
Numerical characteristics of the polarimetric interferometer made by K+ - Na+ ion exchange.
[Aut.]: Marek Błahut.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 9-11, bibliogr. 4 poz.

31/96
Nr opisu: 0000073243
Optical, photoelectric and photomagnetoelectric investigations of semiconductors.
[Aut.]: Marian** Nowak.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 41-47, bibliogr. 2 poz.

32/96
Nr opisu: 0000073237
Organic semiconductor thin films.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 34-35, bibliogr. 5 poz.

33/96
Nr opisu: 0000073236
Oxide semiconductor surfaces and thin films.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 33-34, bibliogr. 6 poz.

34/96
Nr opisu: 0000073133
Photoelectroluminescent electric field intensity sensor.
[Aut.]: Tadeusz Pustelny.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 13-14, bibliogr. 4 poz.

35/96
Nr opisu: 0000073134
Possibility to form refraction profiles of waveguide structures using particular sequences of technological processes.
[Aut.]: Roman Rogoziński.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 14-15, bibliogr. 3 poz.

36/96
Nr opisu: 0000073233
Radiocarbon chronology of prehistoric settlement in the Klisoura George, Greece.
[Aut.]: Anna** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 27-28, bibliogr. 1 poz.

37/96
Nr opisu: 0000073132
Set-up for the measurement of distribution profile of the planar waveguide refractive index.
[Aut.]: Zbigniew Opilski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 11-12, bibliogr. 2 poz.

38/96
Nr opisu: 0000073218
The influence of temperature on the sensitivity of a SAW gas sensor with a thin layer of lead phthalocyanine.
[Aut.]: Marian** Urbańczyk.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 16-17, bibliogr. 10 poz.

39/96
Nr opisu: 0000073242
The penetration depth of Rayleigh surface waves.
[Aut.]: Eugeniusz** Soczkiewicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 40, bibliogr. 2 poz.

40/96
Nr opisu: 0000073230
Variations of isotopic composition of carbon in the karst environment from Southern Poland. Present and past.
[Aut.]: Anna** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1996, s. 25-26, bibliogr. 2 poz.

41/96
Nr opisu: 0000073257
Acoustic emission methods for measurements of partial discharge in power transformers.
[Aut.]: Franciszek Witos.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 21-22, bibliogr. 2 poz.

42/96
Nr opisu: 0000073272
Acoustooptical Bragg interaction in an isotropic medium under uniaxial stress condition.
[Aut.]: Roman Bukowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 40, bibliogr. 2 poz.

43/96
Nr opisu: 0000073277
Analysis of the frequency dispersion of MIS pacitance.
[Aut.]: Stanisław** Kochowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 43-44, bibliogr. 3 poz.

44/96
Nr opisu: 0000073271
Brillouin light scattering experiments in LiTaO3 crystal.
[Aut.]: Tomasz Błachowicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 39, bibliogr. 1 poz.

45/96
Nr opisu: 0000073275
Determination of the thermal determination of the thermal diffusivity of plate-like samples.
[Aut.]: Jerzy Bodzenta.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 42, bibliogr. 1 poz.

46/96
Nr opisu: 0000073255
Electroluminescent electric field intensity sensor.
[Aut.]: Tadeusz Pustelny.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 17-18, bibliogr. 3 poz.

47/96
Nr opisu: 0000073281
Electron transport and magnetic properties of semimagnetic semiconductors.
[Aut.]: Jan* Cisowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 53-55, bibliogr. 6 poz.

48/96
Nr opisu: 0000073260
Environmental radioactivities.
[Aut.]: Anna** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 29, bibliogr. 3 poz.

49/96
Nr opisu: 0000073263
III-V semiconductor surfaces and interfaces. Cleaning of the GaAs(100) surface by surface chemical reactions with atomic (ionized) hydrogen.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 33, bibliogr. 2 poz.

50/96
Nr opisu: 0000073262
III-V semiconductor surfaces and interfaces. Interface Fermi level position on the differently prepared GaAs(100) surface.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 31-33, bibliogr. 6 poz.

51/96
Nr opisu: 0000073265
III-V semiconductor surfaces and interfaces. Methodological developments.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 34, bibliogr. 2 poz.

52/96
Nr opisu: 0000073266
III-V semiconductor surfaces and interfaces. Surface photovoltage in photoemission studies at a:Si/InP(110) heterojunctions.
[Aut.]: Bogusława Adamowicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 35, bibliogr. 3 poz.

53/96
Nr opisu: 0000073253
Integrated optical amplitude refractometer.
[Aut.]: Paweł Karasiński.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 12-15, bibliogr. 4 poz.

54/96
Nr opisu: 0000073258
Isotopic geochronology.
[Aut.]: Anna** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 23-25, bibliogr. 11 poz.

55/96
Nr opisu: 0000073251
Model of the polarimetric interferometer made by K+ - Na+ ion exchange.
[Aut.]: Marek Błahut.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 9-11, bibliogr. 4 poz.

56/96
Nr opisu: 0000073254
Multichannels fiber optic temperature measurement system.
[Aut.]: Tadeusz Pustelny.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 15-16, bibliogr. 3 poz.

57/96
Nr opisu: 0000073279
Optical, photoelectric and photomagnetoelectric investigations of semiconductors.
[Aut.]: Marian** Nowak.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 45-53, bibliogr. 4 poz.

58/96
Nr opisu: 0000073268
Organic semiconductor thin films.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 37-38, bibliogr. 8 poz.

59/96
Nr opisu: 0000073267
Oxide semiconductor surfaces and thin films.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 36, bibliogr. 6 poz.

60/96
Nr opisu: 0000073259
Paleoenvironmental research.
[Aut.]: Anna** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 26-28, bibliogr. 14 poz.

61/96
Nr opisu: 0000073273
Parameters estimation in photothermal measurements with photodeflectional detection.
[Aut.]: Jerzy Bodzenta.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 41, bibliogr. 1 poz.

62/96
Nr opisu: 0000073276
Photothermal investigation of silicon wafers with diamond-like coatings.
[Aut.]: Jerzy Bodzenta.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 43, bibliogr. 2 poz.

63/96
Nr opisu: 0000073278
Propagation of acoustic waves in inhomogeneous media.
[Aut.]: Eugeniusz** Soczkiewicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 44, bibliogr. 1 poz.

64/96
Nr opisu: 0000073252
Research on choosen types of glass for application in planar optics technology.
[Aut.]: Roman Rogoziński.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 11-12, bibliogr. 3 poz.

65/96
Nr opisu: 0000073256
Surface acoustic waves in detection of the selected toxic gases.
[Aut.]: Marian** Urbańczyk.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 18-21, bibliogr. 5 poz.

66/96
Nr opisu: 0000073261
Theory of measurements and statistical methods of data analysis.
[Aut.]: Anna** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1995, s. 30, bibliogr. 1 poz.

67/96
Nr opisu: 0000043921
A surface acoustic wave sensor for NO2 detection.
[Aut.]: Wiesław Jakubik, Marian** Urbańczyk.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 18-19, bibliogr. 4 poz.

68/96
Nr opisu: 0000043942
Acoustooptical Bragg interactions in isotropic media with stimulated optical anisotropy.
[Aut.]: Roman Bukowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 65-66, bibliogr. 5 poz.

69/96
Nr opisu: 0000043936
An universal technology for oxidation of carbon containing materials for radiocarbon dating.
[Aut.]: V. V. Skripkin, N. N. Kovaliukh, Anna** Pazdur, Mieczysław** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 51-52, bibliogr. 1 poz.

70/96
Nr opisu: 0000043941
Application of thermal waves for solid state inspection.
[Aut.]: Jerzy Bodzenta, Barbara** Pustelny, Zygmunt** Kleszczewski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 63-64, bibliogr. 2 poz.

71/96
Nr opisu: 0000043939
Brillouin light scattering on bulk acoustic phonons in LiNbO3 and LiTaO3 crystals.
[Aut.]: Tomasz Błachowicz, Zygmunt** Kleszczewski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 59-60, bibliogr. 8 poz.

72/96
Nr opisu: 0000043929
Computer-based databank for radiocarbon dates of archeological cultures of Peru, Ecuador and Bolivia.
[Aut.]: Adam Michczyński, A. Krzanowski, Mieczysław** Pazdur, M. Ziółkowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 37-38, bibliogr. 4 poz.

73/96
Nr opisu: 0000043937
Data processing in palaeoecology and geology.
[Aut.]: Adam* Walanus.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 53, bibliogr. 3 poz.

74/96
Nr opisu: 0000043946
Determination of optical constants and average thickness if inhomogeneous rough thin films using spectral dependence of optical transmittance.
[Aut.]: Marian** Nowak.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 75-76, bibliogr. 1 poz.

75/96
Nr opisu: 0000043933
Development of selected caves of the Slovak Karst during late quaternary.
[Aut.]: Anna** Pazdur, Mieczysław** Pazdur, Helena* Hercman, P. Mitter.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 46-47, bibliogr. 1 poz.

76/96
Nr opisu: 0000043944
Diffusion of acoustic waves energy in turbulent media.
[Aut.]: Eugeniusz** Soczkiewicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 69-70, bibliogr. 6 poz.

77/96
Nr opisu: 0000043945
Distribution of radiation intensity in a semiconductor film.
[Aut.]: Marian** Nowak.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 73-74, bibliogr. 1 poz.

78/96
Nr opisu: 0000043924
Electronic properties and origin of gap states on the clean SnO2(110) surface exposed to oxygen.
[Aut.]: Jacek Szuber.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 24-25, bibliogr. 11 poz.

79/96
Nr opisu: 0000043925
Electronic properties of the copper phthalocyanine thin films UHV annealed and exposed to oxygen.
[Aut.]: Jacek Szuber, B. Szczepaniak, Stanisław** Kochowski, Aleksander* Opilski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 26-27, bibliogr. 14 poz.

80/96
Nr opisu: 0000043938
Examination of the thermally stimulated exoelectron emission in aspect of the application for sample dating.
[Aut.]: Andrzej** Zastawny, Jan** Białoń.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 54-55, bibliogr. 3 poz.

81/96
Nr opisu: 0000043923
Fiber optic luminescence temperature sensor.
[Aut.]: Tadeusz Pustelny, Zbigniew Opilski, Michał* Wilk.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 22-23, bibliogr. 4 poz.

82/96
Nr opisu: 0000043935
Highly efficient chemical technology of sample preparation for liquid scintillation radiocarbon measurements.
[Aut.]: V. V. Skripkin, N. N. Kovaliukh, Anna** Pazdur, Mieczysław** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 49-50, bibliogr. 1 poz.

83/96
Nr opisu: 0000043919
Inverse photoemission and Kelvin probe studies of the Au/GaP(110) interface.
[Aut.]: Bogusława Adamowicz, M. Grilli, M. Pedio, C. Ottaviani, A. Campo, M. Capozi, C. Quaresima, P. Perfetti.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 14-15, bibliogr. 8 poz.

84/96
Nr opisu: 0000043931
Late Glacial and Holocene water-level changes of the Gościąż Lake, Central Poland, derived from carbon isotope studies of laminated sediment.
[Aut.]: Anna** Pazdur, M. Fontugne, Tomasz* Goslar, Mieczysław** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 42-43, bibliogr. 4 poz.

85/96
Nr opisu: 0000043934
Paleoclimatic implications of radiocarbon dating of speleothems from the Cracow - Wieluń Upland, Southern Poland.
[Aut.]: Anna** Pazdur, Mieczysław** Pazdur, Jacek Pawlyta, A. Górny, M. Olszewski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 48

86/96
Nr opisu: 0000043920
Planar refractometer based on a two-port Mach-Zehnder interferometer in glass.
[Aut.]: Marek Błahut, Roman Rogoziński, Kazimierz Gut, Paweł Karasiński.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 16-17, bibliogr. 2 poz.

87/96
Nr opisu: 0000043922
Planar refractometer made in a waved channel structure.
[Aut.]: Paweł Karasiński, Kazimierz Gut, Marek Błahut, Aleksander* Opilski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 20-21, bibliogr. 5 poz.

88/96
Nr opisu: 0000043947
Radiocarbon and thermoluminescence studies of the karst pipes systems in SW England and S Wales.
[Aut.]: Anna** Pazdur, Andrzej Bluszcz, Mieczysław** Pazdur, I. Morawiecka.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 40-41, bibliogr. 1 poz.

89/96
Nr opisu: 0000043932
Radiocarbon dating and dendrochronology of fortified settlement of Lusatian Culture in Biskupin, Central Poland.
[Aut.]: Anna** Pazdur, Mieczysław** Pazdur, Tomasz* Goslar.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 44-45, bibliogr. 4 poz.

90/96
Nr opisu: 0000043928
Radiocarbon studies of environmental behavior of radioactive graphite from the Chernobyl outburst.
[Aut.]: N. N. Kovaliukh, V. V. Skripkin, Anna** Pazdur, Mieczysław** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 35-36, bibliogr. 1 poz.

91/96
Nr opisu: 0000043943
Simulation of hysteresis effects in C-V characteristics of MIS structures based on the model of interface states distributed in energy and in space.
[Aut.]: Stanisław** Kochowski.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 67-68, bibliogr. 5 poz.

92/96
Nr opisu: 0000043918
Studies of silicon surface electronic parameters using surface photovoltage and photoconductivity methods.
[Aut.]: Bogusława Adamowicz.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 12

93/96
Nr opisu: 0000043927
The calibration of radiocarbon time scale at the end of last glaciation.
[Aut.]: Tomasz* Goslar.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 33-34, bibliogr. 1 poz.

94/96
Nr opisu: 0000043930
The databank of radiocarbon dates from East and Central Europe: towards unified absolute chronology of archeological cultures.
[Aut.]: Danuta Michczyńska, Adam Michczyński, Anna** Pazdur, Mieczysław** Pazdur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 39, bibliogr. 1 poz.

95/96
Nr opisu: 0000043940
The modified theory of photodeflection detection applied in photothermal measurement.
[Aut.]: Jerzy Bodzenta, Roman Bukowski, Zygmunt** Kleszczewski, Jacek* Mazur.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 61-62, bibliogr. 3 poz.

96/96
Nr opisu: 0000043926
UHV system for studies of cleaning procedure of semiconductor surfaces by surface chemical reactions with ionized hydrogen.
[Aut.]: Jacek Szuber, Michał* Piwowarczyk, Adam* Girycki.
-Ann. Report Siles. Tech. Univ., Inst. Phys. 1994, s. 28-29, bibliogr. 9 poz.

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